Dynamic measurements

Design and test engineers can now use a single modular instrument to make a wide range of dynamic measurements.


Design and test engineers can now use a single modular instrument to make a wide range of dynamic measurements with the new National Instruments’ PXI-5922 digitizer.



By combining the new module with LabVIEW 7.1, they can create numerous types of instruments such as AC voltmeters, audio analysers, frequency counters, spectrum analyzers or I/Q modulation.



Unlike traditional measurement devices that have a fixed resolution for all sample rates, the NI PXI-5922 digitizer uses the NI FlexII ADC that has flexible resolution and can sample anywhere from 16 bits at 15 MS/sec to 24 bits at 500 kS/sec.



The NI FlexII ADC also incorporates patented NI methods for reducing the linearity and temperature drift errors inherent to multi-bit sigma-delta converters to achieve a large dynamic range at high sample rates. Low-level signals can be digitised without the need for external signal conditioning, such as filters and low-noise amplifiers.



The module is built on NI’s Synchronization and Memory Core (SMC) architecture for tight synchronization with other SMC-based products such as high-speed digitizers, arbitrary waveform generators and digital waveform generator/analyzers.



Engineers can use the module to create mixed-signal stimulus response measurements or to expand the number of acquisition channels up to 1,632 channels by synchronizing multiple NI PXI-5922 modules.