Cheshire, UK, 26th August 2009: In partnership with CEMMNT, MM Live is pleased to announce the introduction of the Metrology in Micro Manufacturing Workshop, which will take place during the afternoon session of Day 2, 21st October, of the Micro Manufacturing Conference. MM Live is being held at the Ricoh Arena, Coventry on 20-21st October.
There is no doubt that the UK is highly competitive in global R&D endeavours in micro and nano technology, and it is important that the commercialisation of these technologies keeps pace. More and more products rely on materials with structure engineered in the micro and nano-metre ranges, which offer new or enhanced properties such as increased strength, light emission, and biocompatibility. These structures and particles offer a route to improved performance of products in a diverse range of sectors, from inhalers and skin creams in the pharmaceutical industry, microelectronics and MEMS devices, through to fuel additives and anti-fog windscreens in the automotive industry. The incentive to develop and manufacture safe, reliable products that are smaller, cheaper, harder, stronger, and/or lighter inherently drives the need for advanced, high quality measurement and characterisation at the micro and nano scale.
CEMMNT brings these tangible benefits of metrology to a wider audience at MM Live. Visitors will experience, through case study-based presentations, how the latest measurement techniques have benefited manufacturing companies large and small. See how R&D challenges can be better understood and overcome, how product quality and process efficiencies can be improved and how manufacturing cost and time-to-market can be reduced.
The Metrology in Micro Manufacturing Workshop, Chaired by Paul Newbatt from CEMMNT, begins at 1.30 pm and includes presentations from the leading experts in this field including: Professor Richard Leach, from NPL, who will present ‘Measurement & Characterisation of Modern Structured Surfaces’. This paper looks at how the use of 3D structured surfaces can have a drastic effect on the functionality of a component.
Stefan Scherer, CEO of Alicona UK, will take to the stage and present ‘Optical 3D Measurements by Focus Variation for Quality Assurance in the Micro- and Nano Range’, which looks at how the advancements in micro-engineering have created new requirements for the measurement of these complex features.
‘The A – Z of Interferometry — Everything from Automated Flight Simulation Across a Micro-Surface to Z-Stitching’ will be presented by Dr Mike Conroy from Taylor Hobson. The presentation discusses how interferometry is becoming more and more important for the study of micro manufactured components. The full programme can be found online at www.micro-show.com.
On the exhibition floor itself, visitors will find the leading suppliers in the metrology and inspection field who will be on hand to give advice and demonstrate live their revolutionary techniques. Exhibiting companies include: Kistler, NPL, Alicona, Konica Minolta, Olympus, Vision Engineering, CEMMNT, Lambda Photometrics, Wenzel, Steinbichler, Werth, Geomagic, FARO, GOM, 3D Digital and Carl Zeiss.
For the full conference programme and to pre-register, please visit
www.micro-show.com. Only pre-registered delegates will be admitted, as places are limited.
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