IBM Silicon Germanium In New Test Instrumentation

Tektronix has announced that its TDS7000 Series Digital Phosphor Oscilloscope (DPO) is the first test and measurement instrument to employ Silicon Germanium (SiGe) technology developed by IBM.

The co-development project has enabled Tektronix to provide test instrumentation with record-breaking performance to its customers who are advancing telecommunications networks and driving Internet technologies.

In 1998, IBM became the first company to introduce silicon germanium chip-making technology into mainstream manufacturing. SiGe semiconductors provide high performance and less power consumption at a lower cost over standard silicon, helping to usher in new breeds of applications and communications devices.

TDS7000 models range from 500 MHz to 4GHz bandwidth with single-shot sample rates to 20 GS/s, meeting demands of the latest high speed logic families and multi-Gigabit communication standards. Acquisition memory options range from 2 to 32 Megasamples. High performance jitter analysis is to 1ps RMS.

More information at:

www.tektronix.com/Measurement/scopes/index.html