Tektronix has announced that its TDS7000 Series Digital Phosphor Oscilloscope (DPO) is the first test and measurement instrument to employ Silicon Germanium (SiGe) technology developed by IBM.
The co-development project has enabled Tektronix to provide test instrumentation with record-breaking performance to its customers who are advancing telecommunications networks and driving Internet technologies.
In 1998, IBM became the first company to introduce silicon germanium chip-making technology into mainstream manufacturing. SiGe semiconductors provide high performance and less power consumption at a lower cost over standard silicon, helping to usher in new breeds of applications and communications devices.
TDS7000 models range from 500 MHz to 4GHz bandwidth with single-shot sample rates to 20 GS/s, meeting demands of the latest high speed logic families and multi-Gigabit communication standards. Acquisition memory options range from 2 to 32 Megasamples. High performance jitter analysis is to 1ps RMS.
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