Jitter free testing

Agilent Technologies today announced the industry’s first high-speed, serial pulse data generator with stimulus capability up to 7GHz.


Agilent Technologies

today announced the industry’s first high-speed, serial pulse data generator with stimulus capability up to 7GHz, enabling computer and semiconductor test engineers to accurately characterise components being developed for the next-generation serial buses used in high-speed transmission systems.

Agilent says its new 81141A allows engineers, for the first time, to conduct reliable and accurate physical layer tests by providing precision low-jitter signals and offering full control of data streams for stress tests. Its linear delay modulation enables fast and ultraprecise jitter tolerance and jitter transfer measurements.

“The combination of multiple data formats such as RZ, R1 and NRZ with sequencing, trigger capability and high-speed frequency is unique in the market and critical for the next-generation high-speed technology wave,” said Siegfried Gross, vice president and general manager of Agilent’s Digital Verification Solutions division. “High-speed design starts with the physical layer and its signal integrity.”

Versatile, high quality and the most precise data signals are the key contributions of the 7GHz pulse data generator. Other features include: data formats RZ, R1 and NRZ, with flexible parameters and fast transition times for high-quality waveforms and eye diagram measurements; pattern and sequence capabilities enabling stimulus signals for the entire range of digital high-speed serial buses; and linear delay modulation up to 1GHz for jitter tolerance testing.

The Agilent 81141A 7 GHz serial pulse data generator is available now, with shipments starting in September 2005.