PXI switch modules for ATE

National Instruments has released five new high-density PXI and SCXI flexible switch modules to meet the design needs of automated test equipment engineers.

National Instruments has released five new high-density PXI and SCXI flexible switch modules to meet the design needs of automated test equipment (ATE) engineers.

The PXI-2530 and SCXI-1130 switch modules are 128-channel and 256-channel, multiconfiguration multiplexers/matrices. With 14 possible topologies and multiple expansion options, these modules offer a solution for large or complex high-channel-count systems with a switching speed of 900 ch/sec. These modules can be used as a front-end for high-speed measurement devices, such as the NI PXI-4070 6 ½-digit FlexDMM, in applications such as ECU or IC testing.

The PXI-2529 high-density multiconfiguration matrix brings a 128 crosspoint, two-wire matrix to a single-slot 3U PXI module. Able to switch up to 150 VDC or 150 Vrms CAT I and up to 1 A switching/2 A carry, this module is designed for systems that require the flexibility of routing multiple test points to several instruments in a matrix configuration. With it, engineers now can create an expandable test platform involving several modular instruments in the same PXI chassis.

Finally, the PXI-2567 and SCXI-1167 64-channel, multipurpose relay drive modules accommodate up to 50 V or 600 mA of drive capacity. These modules can drive many types of external relays, including high-current, high-voltage or multipole RF switches. Like other NI switches, relay drive modules make use of NI-SWITCH driver software, so engineers can program external relays connected to the relay driver and standard PXI and SCXI switch products identically.

All NI switch hardware works with NI LabVIEW graphical development environment and NI Switch Executive switch management software. Additionally, the new switch modules track and store relay cycle counts that engineers can use to perform predictive maintenance on the switch module. The modules also support hardware-triggered scanning. This makes the test sequences highly deterministic, ensuring tight synchronisation between measurement devices and the switches.