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Carl Zeiss has released the Axio CSM 700 confocal microscope for rapid and robust non-contact measurement of 3D microstructures and determination of surface roughness.

The Axio CSM 700 is ideal for materials research, quality inspection and routine applications.

It displays surfaces three-dimensionally in high resolution and in true colour even on relatively soft surfaces.

The high-quality Zeiss optics perform topographical measurements at up to 117 frames a second.

The Axio CSM 700 detects step heights from approximately 20nm up to the millimetre range at a depth of focus previously only possible with the scanning electron microscope.

These attributes are useful for examining materials including LCD panels, semiconductors, colour filters, glass, polymers and metals.

The Axio CSM 700 is easy to operate: all of its major functions and measurement parameters are controlled by a large LCD control panel.

This is complemented by the control software, which provides analysis options, including the measurement of roughness, evaluation of layer thickness and particle analysis.

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