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Keithley Instruments has released the 4225-PMU Ultra Fast I-V Module for the Model 4200-SCS Semiconductor Characterization System.

It integrates ultra-fast voltage waveform generation and current/voltage measurement capabilities into the Model 4200-SCS’s already powerful test environment to deliver a broad and dynamic range of voltage, current and rise/fall/pulse times.

This expands the system’s materials, device and process-characterisation potential.

The Model 4225-PMU makes ultra-fast I-V sourcing and measurement as easy as making DC measurements.

Its wide programmable sourcing and measurement ranges, pulse widths and rise times make it suited for applications that demand ultra-fast voltage outputs and synchronised measurement – from nanometre CMOS to flash memory.

The Model 4225-PMU’s broad dynamic range allows the full range of materials, devices and processes to be characterised with a single set of instrumentation.

Labs can now configure one flexible system to handle all three measurement types: precision DC I-V (Model 4200-SMU), AC impedance (Model 4210-CVU C-V Instrument) and ultra-fast I-V or transient I-V (Model 4225-PMU).

Each 4225-PMU module provides two channels of integrated sourcing and measurement but takes up only one slot in the nine-slot chassis.

Each chassis can accommodate up to four modules for a maximum of eight ultra-fast source/measure channels.

Each channel combines high-speed voltage outputs (with pulse widths ranging from 60 nanoseconds to DC) with simultaneous current and voltage measurements.

The module provides high-speed voltage pulsing with simultaneous current and voltage measurement at acquisition rates of up to 200 megasamples/second (MS/s), with 14-bit analogue-to-digital converters (A/Ds) using two A/Ds per channel (four A/Ds per card).

Users can choose from two voltage source ranges (+/-10V or +/-40V into one megaohm) and four current-measurement ranges (800mA, 200mA, 10mA or 100microA).

Each Model 4225-PMU can be equipped with up to two optional Model 4225-RPM Remote Amplifier/Switches, which provide four additional low-current ranges.

They also reduce cable-capacitance effects and support automatic switching between the Model 4225-PMU, the Model 4210-CVU and other SMUs installed in the chassis.

The Model 4220-PGU Pulse Generator Unit, which offers a voltage-sourcing-only alternative to the Model 4225-PMU, is also available.

Together, the 4225-PMU and 4225-RPM provide all the tools necessary to perform an array of applications that no other single instrument chassis can support.

Making general-purpose ultra-fast I-V measurements is one of the key application areas for the 4225-PMU and 4225-RPM combination.

Pulsed I-V testing has a variety of uses, including preventing device self-heating by using narrow pulses and/or low-duty cycle pulses rather than DC signals.

The 4225-PMU/4225-RPM’s high-speed voltage sourcing and current-measurement sensitivity make them well-suited for CMOS device characterisation, including high-K devices and advanced CMOS technologies such as silicon-on-insulator (SOI).

The system’s KTEI software includes toolkits for testing both flash and phase change memory (PCM) devices.

The system is well-suited for testing single memory cells or a small array, such as in research and development or process verification.

The Model 4225-PMU is useful for characterising III-V materials, such as gallium nitride (GaN), gallium arsenide (GaAs) and other compound semiconductors.

It allows a pulse-offset voltage to be set so measurements can be made from a non-zero value, for investigating the amplifier gain or linearity of a device.

The optional Model 4200-BTI-A Ultra-Fast BTI Package combines all the hardware and software needed to implement all known BTI test methodologies with the fastest most sensitive measurements available.

In addition, automatic characterisation suite (ACS) software supports full wafer- and cassette-level automation and includes NBTI/PBTI test libraries with easy-to-use GUIs.

The Model 4225-PMU can generate four types of sweeps: linear sweep, pulsed, arbitrary waveform and segment ARB.

The segment ARB mode simplifies creating, storing and generating waveforms made up of up to 2048 user-defined line segments for exceptional waveform-generation flexibility.

An optional multi-measurement performance cable kit connects the Model 4200-SCS to a prober manipulator, simplifying switching between DC I-V, C-V and ultra-fast I-V testing configurations, eliminating the need for re-cabling and enhancing signal fidelity.

All three products will be available from the beginning of May 2010.

Keithley Instruments

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