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Nikon Metrology has introduced the compact XT V 130 X-ray inspection system, which traces failures inside complex electronic devices and multilayer circuit boards.

To maintain high-quality standards in an environment of continuous miniaturisation, electronics manufacturers prefer deploying reliable and efficient X-ray imaging capabilities in house.

The XT V 130 is claimed to be a compact and affordable X-ray system for automated QA on serial-produced electronic samples.

The inspection system will be demonstrated at the Productronica show in Munich, Germany, on 10-13 November.

Hidden electronic defects arising during production or assembly generally result in system failure, fabrication delay and additional cost.

These defects can be detected efficiently early on in the process by taking an in-depth look at the inside of electronic specimens.

Designed for high-throughput electronics X-ray inspections, the XT V 130 is a QA workhorse that allows operators to provide instant pass/fail status, according to the company.

Automated inspection functions and optional automatic board identification ensure high inspection throughput rates.

Inspection reports compliant with MRP systems facilitate tight integration into customers’ manufacturing processes.

Today, any original equipment manufacturer and subsystem supplier of consumer, automotive, aerospace, medical and electronics can use X-ray inspection technology to get the job done.

The system comes with a 30-130kV open micro-focus X-ray source, a four-axis programmable manipulator and a 16-bit imaging system based on a 4in (10cm) image intensifier.

A focal spot size down to 3 microns, 320x geometric magnification and tilt angle up to 60 degrees offer high image quality and sufficient flexibility.

A rotate-stage and CT capability is available as an option.

A hinged door provides access to the inspection area, which fits samples up to 40 x 35cm (16 x 14in).

Using qualitative real-time X-ray capabilities, operators navigate through the layers of a printed circuit board (PCB) or inside electronic devices by changing position, angle and zoom as desired using the joystick.

The XT V 130 system can quickly trace material inconsistencies, connectivity issues, incomplete through-layer vias and other failures.

The operation of the compact XT V 130 system is controlled by Inspect-X, the proprietary software used on all Nikon Metrology XT systems.

Inspect-X carries out X-ray image processing and analysis and features a set of automation capabilities.

Developed to streamline the inspection process with ultrafast X-ray acquisition, the XT V 130 runs first-article inspection in minutes, instead of hours or days.

The Nikon Metrology XT V 130 system is claimed to offer a low cost of ownership.

The open X-ray tube installed in the system allows for the quick replacement of low-cost filaments.

All serviceable components are installed on a drawer that can be opened from the front, making the system easy to service.

Thanks to its small footprint, which is limited to 1m2, a built-in generator and weight below 1,150kg, the XT V 130 system fits any electronics production area without requiring high-voltage power or special floor conditions.

The system’s protective enclosure means that the use of dedicated badges or protective clothing can be avoided.

The possibility to configure a flat-panel imager enables the system to acquire images with high resolution.

The XT V 160 offers a CT capability, a 75-degree tilt angle and a standard rotate stage with true concentric imaging to readily reveal and resolve weak points in the PCB manufacturing process.

To obtain faster access to the inspection area and to better view the sample, the sliding window is replaced by a standard door and window combination.

This modification also allows larger samples to be inserted into the system and facilitates access to the gun for filament changes.

To simplify system operation, all controls have been centralised into a single panel.

The sample manipulator has been strengthened further to make the concentric movement of the sample even more accurate and stable, according to the company.

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