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Keithley Instruments’ new Model 2651A High Power System Sourcemeter instrument provides a wide current range, making it suitable for a variety of RandD, reliability and production test applications.

The latest addition to the company’s Series 2600A System Sourcemeter range, it is specifically designed for characterising high power electronics.

Possible applications include testing high brightness LEDs (HBLEDs), power semiconductors, DC-DC converters, batteries and other high-power materials, components, modules and subassemblies.

According to Keithley, the Model 2651A offers a flexible four-quadrant voltage and current source/load, coupled with precision voltage and current meters.

In a single full-rack enclosure, it combines the functionality of multiple instruments: a semiconductor characterisation instrument, precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic load, and trigger controller.

It is also fully expandable into a multi-channel synchronised system via Keithley’s TSP-Link technology.

The Model 2651A can source or sink up to 2,000W of pulsed power (+/-40V, +/-50A) or 200W of DC power (+/-10V at +/-20A, +/-20V at +/-10A, +/-40V at +/-5A).

It provides a choice of digitising or integrating measurement modes for precise characterisation of both transient and steady-state behavior.

Two independent analogue-to-digital (A/D) converters define each mode, one for current and the other for voltage, which run simultaneously for accurate source readback without sacrificing test throughput.

The digitising measurement mode’s 18-bit A/D converters allow capturing up to one million readings per second for continuous one-microsecond-per-point sampling, making this mode the most appropriate choice for waveform capture and measuring transient characteristics with high precision.

The integrating measurement mode, based on 22-bit A/D converters, optimises the instrument’s operation for applications that demand the highest possible measurement accuracy and resolution.

This ensures precise measurements of the very low currents and voltages common in next-generation devices.

All Series 2600A instruments provide integrating measurement mode operation.

Connecting two Model 2651A units in parallel via TSP-Link expands the system’s current range from 50A to 100A.

The voltage range can be expanded from 40 to 80V when two units are connected in series.

The embedded Test Script Processor (TSP) included in all Series 2600A instruments simplifies testing by allowing users to address multiple units as a single instrument, so that they act in concert.

The built-in trigger controller in the Model 2651A can synchronise the operation of all linked channels to within 500 nanoseconds.

These capabilities of the Model 2651A provide a wide dynamic range, making the unit suitable for a variety of high-current, high-power test applications, including: Power semiconductor, HBLED, and optical device characterisation and testing.

To minimise device self-heating during tests, which is a common problem with high-power semiconductors and materials, the Model 2651A offers high-speed pulsing capabilities that allow users to source and measure pulses with high accuracy.

Pulse widths from 100 microseconds to DC and duty cycles from one to 100 per cent are programmable.

Competing solutions are typically hampered by limited flexibility for programming the instrumentation’s duty cycle.

TSP Express, Keithley’s LXI-based I-V test software utility, is embedded in the instrument so there’s no need for software installation or programming.

In both basic and advanced tests, TSP Express delivers device data in three easy steps: connect, configure, and collect.

It also simplifies connecting instruments to allow higher pulsing levels.

Results can be viewed in either graphical or tabular format and then exported to a .csv file for use with spreadsheet applications.

Two other powerful software tools for creating test sequences are also provided.

The Test Script Builder application supports creating, modifying, debugging, running and managing TSP scripts.

An IVI-based Labview driver simplifies integrating the Model 2651A into Labview test sequences.

The Model 2651A will be available in April 2011.

Keithley Instruments

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