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‘How to test high-speed memory with non-intrusive embedded instruments’ - .PDF file.

A new white paper from Asset Intertech, entitled ‘How to test high-speed memory with non-intrusive embedded instruments’, explains how non-intrusive software-driven embedded instruments can overcome many of the challenges of testing, validating and debugging high-speed memory buses, such as the DDR3 or DDR4 buses.

White paper contents

  • Executive summary
  • What’s the problem?
  • Where’s the problem?
  • What is a memory test?
  • How to solve the problem
  • Boundary-scan test
  • Functional test
  • Processor-controlled test
  • FPGA-based memory tests
  • ASIC-based memory tests
  • Microprocessor- and chipset-based MBIST
  • Availability of various NBT memory test solutions
  • Trade-offs
  • Summary and conclusions

Click on the link above to download the white paper.

White paper: how to test high-speed memory with non-intrusive embedded instruments

A new white paper from Asset Intertech, entitled ‘How to test high-speed memory with non-intrusive embedded instruments’, explains how non-intrusive software-driven embedded instruments can overcome many of the challenges of testing, validating and debugging high-speed memory buses, such as the DDR3 or DDR4 buses.

White paper contents

  • Executive summary
  • What’s the problem?
  • Where’s the problem?
  • What is a memory test?
  • How to solve the problem
  • Boundary-scan test
  • Functional test
  • Processor-controlled test
  • FPGA-based memory tests
  • ASIC-based memory tests
  • Microprocessor- and chipset-based MBIST
  • Availability of various NBT memory test solutions
  • Trade-offs
  • Summary and conclusions

Click on the link above to download the white paper.

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