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Kreon Technologies offers the Zephyr II laser scanner, which offers 3D measurement for inspection and reverse engineering in tasks such as quality control of tools, dies and moulds, product design and development, and gap and flush measurement.

The Zephyr II features the AQC, which, according to Kreon, enables an increase in system performance and accuracy. The AQC enables the user to automatically control scan data. Automatic compensation of different materials’ optical characteristics is performed during scanning to aid quality. Functions that enable the evaluation of optimal scanning distances are also available.

Key specifications

  • Speed: up to 500Hz
  • Accuracy: 15μm
  • Laser line length: 100mm
  • Measuring field: 130mm
  • Stand-off distance: 95mm
  • Laser class: II
  • Size: 140 x 110 x 70mm
  • Weight: 480g
  • Automatic quality check
  • Compatible with 3D CMMs, portable measuring arms, robots and CNC machine tools
  • Compatible with high-resolution scales

KREON’s corporate headquarters in Limoges house the Hardware and Software Research and Development units, as well as the Manufacturing, Sales, Marketing and Technical Support Operations departments.

Founded in 1991, KREON TECHNOLOGIES is a French based developer of patented technology in high speed, 3D laser scanning systems for a broad range of industries and applications.

In its early years, KREON TECHNOLOGIES provided one industry with one product but today its offer has evolved to complete solutions for quality control, reverse engineering, surface inspection and rapid prototyping throughout the whole manufacturing process for the automotive and aerospace industries as well as design, medical, dental, shoe, etc… 

Well-known for their technological advance, KREON systems are installed all over the world thanks to a wide network of partners and specialists responsible for marketing, sales and technical support.

The first generation of laser scanners is being replaced by new, innovative products stemming from years of experience and know-how acquired in 3D non-contact measurement systems.

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