Fingermarks method gives boost to forensics

The method will allow observation of fingermarks from objects such as bullet casings with greater detail and accuracy than traditional forensic methods.

Scientists from Nottingham University’s School of Physics and School of Pharmacy have developed a rotation stage to allow researchers and forensic practitioners to perform highly sensitive, non-destructive Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) measurements and develop high-resolution fingerprint images on surfaces that conventional fingerprint imaging fails to pick up. The rotation stage is claimed to open up new possibilities for the retrieval of high-resolution fingerprints from the whole surface area of challenging shapes and materials.

“We already proved in our previous research that ToF-SIMS imaging provides much more accurate and detailed fingerprint images on different types of surface,” Dr James Sharp, School of Physics and Astronomy, said in a statement. “This new rotational capability allows us to image in even more detail and over whole surface areas of difficult materials and shapes whilst keeping the evidence intact.”