HIDRA Vision wafer imaging technology to join UK incubator programme

Developed at the National Physical Laboratory (NPL), the so-called HIDRA Vision is a new patent-pending semiconductor wafer imaging technique claimed to tackle yield limitation in compound semiconductor manufacturing. According to NPL, the wafer imaging technology captures high-resolution images, with approximately two million points on the wafer, in a few minutes rather than hours or days with traditional systems.

HIDRA also captures detailed high-dimensional information that enables correct identification of defects. HIDRA Vision could help realise significant cost savings as it is able to quickly measure whole semiconductor wafers compared to traditional methods that are slow and can miss material defects.

In a statement, Dr Yameng Cao, NPL Senior Scientist and HIDRA Vision CTO, said, "The Silicon Catalyst is world-renowned for its success in incubating new semiconductor related businesses and we can’t wait to start the programme and work with the mentors and advisors and take part in the training. We believe this will really help us accelerate our business growth.”