Fast, Precise Elemental Analysis for Process Control

The iQ II EDXRF Spectrometer gives precise, accurate analytical results on demanding process control samples, says manufacturer SPECTRO Analytical Instruments GmbH. Oil refiners, lubricating oil manufacturers, mineral and cement producers and many other industries will find this instrument attractive because of its simplicity of operation and impressive sensitivity for the often critical “light” elements like Na, Mg, Al, Si, P, S and Cl.

The advanced polarised X-ray optical system uses a curved HOPG (highly oriented pyrolytic graphite) crystal located very close to the sample, ensuring optimum excitation for light elements. By combining this optical system with a 50 kV X-ray tube and an exceptionally powerful Peltier-cooled Silicon Drift Detector, performance approaching that of much more expensive Wavelength Dispersive (WDXRF) instruments can be achieved in many applications, for both light and trace elements in liquid and loose powder samples, Helium flushing can be used with the iQ II to enhance light element performance, but unlike most small EDXRF instruments the user can also measure pelletised or fused samples under vacuum conditions, thereby dramatically reducing operating costs over the life of the instrument. A new generation of sample cassettes makes possible the extremely accurate sample positioning system in the iQ II, helping to achieve the high analytical precision required for industrial QC applications.