Surface roughness is one of the most important quality parameters for wafer materials in industry and science. Atomic force microscopy is a perfect method to evaluate surface roughness with high precision.
An optimized measurement workflow for wafer handling, batch measurement and data evaluation enables analysis on nano-scale with high efficiency.
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Virgin Atlantic’s Flight100 saved 95 tonnes of CO2 in first SAF flight
Good comment. I think these reports are different from many others , in that they were prepared outside the government and the issues, they raised, of...