Surface roughness is one of the most important quality parameters for wafer materials in industry and science. Atomic force microscopy is a perfect method to evaluate surface roughness with high precision.
An optimized measurement workflow for wafer handling, batch measurement and data evaluation enables analysis on nano-scale with high efficiency.
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UK Automotive Feeling The Pinch Of Skills Shortage
Aside from the main point (already well made by Nick Cole) I found this opinion piece a rather clunking read: • Slippery fish are quite easy to...