Further progress in the synthesis and fabrication of new solar cell devices strongly depends on the ability to measure their properties rapidly with highest precision. Such solar cell assemblies are often synthesized in the form of thin films (film thickness typically smaller than 200 nanome-ters). The measurement of such films is challenging and often complimentary methods are needed to fully understand the function of such films. With atomic force microscopy (AFM using Tosca 400) and grazing-incidence X-ray scattering methods (GISAXS/GIWAXS with the SAXSpoint 2.0 system) Anton Paar can offer state-of-the-art solutions for the characterization of such advanced solar devices.
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Comment: The UK is closer to deindustrialisation than reindustrialisation
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